[sdiy] More about IC design
Dave Manley
dlmanley at sonic.net
Sun Jul 12 06:30:23 CEST 2009
The whole point of all the test procedures is to toss out a bad part as
soon as possible.
The cost of a bad part goes up the further thru the manufacturing
process it gets. From best place to worst place is something like this:
1. on the wafer before the individual die are cut
2. at die before packaging
3. after packaging
4. after the part is assembled on to a pcb (trust me manufacturers get
really unhappy if they find your part has a problem after they have put
it on a board with a lot of other expensive components!)
5. at unit test after the pcb is assembled into a housing
6. at the end customer
There is a lot of science and engineering in making ICs, so that from
start to finish as few bad parts as possible are manufactured, and that
the process captures as many bad parts as possible, of course at a
reasonable cost to the manufacturer. Some amount of bad parts are going
to escape and someone will have to pay to resolve the issue, it just
part of the cost of doing business. In the end, this is really no
different than any other manufacturing process, you need Quality all
through the process, whatever it is you are building, whether it is ICs
or power cables for synth modules!
There's another whole interesting chapter of IC development related to
getting a prototype chip back and what you can do to diagnose the
failure, and to try a fix. A process known as 'FIB'ing (Focused Ion
Beam) allows you to basically drill down into the device and do cut and
jumps. Try green wiring a sub-micron design!
This is now a long way from SDIY!
-D
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