Heat results

Tony Clark clark at andrews.edu
Tue Feb 2 21:28:39 CET 1999


   Since I'm sure someone will like to have this data, the following are 
two tests I did with a VCO I designed.  The first test is a standard 
uncompensated two transistor current mirror design using a MAT02:

Temp   Fc=100Hz   Fc=1kHz   Fc=10kHz
-------------------------------------
25C    100Hz      1.00kHz   10.0kHz
30C    102Hz      1.03kHz   9.80kHz
35C    106Hz      1.04kHz   9.60kHz
40C    111Hz      1.05kHz   9.43kHz
-------------------------------------

   The second test utilized a MAT04 in a 3:1 transistor current mirror:

Temp   Fc=100Hz   Fc=1kHz   Fc=10kHz
-------------------------------------
25C    100Hz      1.00kHz   10.0kHz
30C    102Hz      980Hz     9.6kHz
35C    104.2Hz    970Hz     9.3kHz
40C    106.9Hz    961Hz     9.0kHz
-------------------------------------

   Anyway, as you can see, there is a definate point where the drift 
changes from positive to negative (although I didn't bother to try to 
find the critical frequency).
   Interestingly, with the MAT02 circuit, the worst case error occurs in 
the 100Hz range, whereas in the MAT04 circuit, the worst case error was 
in the 10kHz range.  I don't suppose that's any better, but it is 
interesting, none-the-less.
   Hope this has been of interest to someone.

   Tony

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